Test Services – Success Stories
Wafer Probe Contract with SunPower Corp. Involved Over 140,000,000 Optical Die Probed with Zero Errors
The project represented the largest contract test services order in JVD’s history. JVD’s relationship with SunPower began when the company began to test SunPower’s early line of ICs. The relationship grew to the point where JVD was testing over 50 different devices for SunPower. As SunPower’s product line evolved, JVD began testing their IrDA devices.
One device, an IrDA data acquisition device, became a stellar success and JVD became Sun Power’s contract test house for over seven years, testing over 140 million chips. JVD’s reputation as a test services organization was already well known in Silicon Valley but the company had never been challenged with volumes of this magnitude.
“We began working with JVD in 1995, having them test a variety of different devices for us,” said Bobby Ram, Sunpower Inc.’s Director of Global Community Relations. “They worked with us as we grew our business, ultimately leading to a seven year, 140,000,000 unit, relationship to test our Infrared Data Acquisition chips. The quality of their work and their exuberant attitude to constantly beat our expectations cemented the relationship from day one.”
Wafer probe contract with Quicksil involved over 70,000,000 capacitors.
QuickSil, a Silicon Valley boutique foundry, had a contract to deliver rf tuning capacitors. QuickSil had the right equipment and processes to produce the tiny capacitors but needed a reliable test house to probe them to their customer’s exacting standards. Eleven different products were involved, ranging in value from 2pf to 1000pf.
The challenge was to test very small capacitances to high accuracy without introducing stray capacitance from the probe tips or nearby apparatus.
The entire project spanned 5 years, during which no test errors were reported.